RO
SR EN 61000-4-20:2011
Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques - Emission and immunity testing in transverse electromagnetic (TEM) waveguides
IEC 61000-4-20:2010 relates to emission and immunity test methods for electrical and electronic equipment using various types of transverse electromagnetic (TEM) waveguides. These types include open structures (for example, striplines and electromagnetic pulse simulators) and closed structures (for example, TEM cells). These structures can be further classified as one-, two-, or multi-port TEM waveguides. The frequency range depends on the specific testing requirements and the specific TEM waveguide type. The object of this standard is to describe: - TEM waveguide characteristics, including typical frequency ranges and EUT-size limitations; - TEM waveguide validation methods for EMC tests; - the EUT (i.e. EUT cabinet and cabling) definition; - test set-ups, procedures, and requirements for radiated emission testing in TEM waveguides and - test set-ups, procedures, and requirements for radiated immunity testing in TEM waveguides. IEC 61000-4-20:2010 does not intend to specify the tests to be applied to any particular apparatus or system(s). The main intention of this stan
Status :
Withdrawn
Approval date : 5/31/2011
Withdrawal date : 3/25/2025
Number of pages : 157
ICS : 33.100.10 Emission,33.100.20 Immunity
Technical Committee : 30 - Electromagnetic compatibility and radio interference
- Replaces SR EN 61000-4-20:2003
- Replaces SR EN 61000-4-20:2003/A1:2008
- Replaced by SR EN IEC 61000-4-20:2022