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SR EN ISO 18452:2016

Fine ceramics (advanced ceramics, advanced technical ceramics) - Determination of thickness of ceramic films by contact-probe profilometer (ISO 18452:2005)

ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.

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Status : Valid
Approval date : 9/30/2016
Number of pages : 18
ICS : 81.060.30 Advanced ceramics
Technical Committee : 119 - Glass and ceramic ware

Relations with other standards: