SR EN ISO 11562:1999

Geometrical product specifications (GPS). Surface texture: Profile method. Metrological characteristics of phase correct filters

Describes the metrological characteristics of phase correct filters for the measurement of surface profiles. In particular it specifies how to separate the long and short wave content of a surface profile.

Status : Withdrawn
Approval date : 3/25/1999
Publish date : 3/26/1999
Withdrawal date : 12/21/2012
Number of pages : 16
ICS : 17.040.20 Properties of surfaces
Technical Committee : 58 - Metrology

Relations with other standards: