SR EN ISO 16526-1:2020
Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 1: Voltage divider method (ISO 16526-1:2011)
ISO 16526-1:2011 specifies a method for the direct and absolute measurement of the average high voltage of constant potential (DC) X-ray systems on the secondary side of the high voltage generator. The intention is to check the correspondence with the indicated high voltage value on the control unit of the X-ray system. This method is applied to assure a reproducible operation of X-ray systems because the voltage influences particularly the penetration of materials and the contrast of X-ray images and also the requirements concerning the radiation protection.
Status :
Valid
Approval date : 5/29/2020
Number of pages : 14
ICS : 19.100 Non-destructive testing
Technical Committee : 40 - Non-destructive testing
- Replaces SR EN 12544-1:2001
- Replaces SR EN 12544-2:2001
- Replaces SR EN 12544-3:2001
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