RO
SR EN 60444-2:2003
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network -- Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
Describes a method of measuring the motional capacitance of quartz crystal units in the frequency range 1 MHz to 125 MHz with a total measurement error of the order of 5%.
Status :
Valid
Approval date : 6/30/2003
Publish date : 7/1/2003
Number of pages : 27
ICS : 31.140 Piezoelectric devices
Technical Committee : 18 - Piezoelectric devices for frequency control and selection