RO
SR EN 60747-5-3:2003
Discrete semiconductor devices and integrated circuits -- Part 5-3: Optoelectronic devices - Measuring methods
Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.
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Status :
Withdrawn
Approval date : 10/30/2003
Publish date : 10/31/2003
Withdrawal date : 12/29/2023
Number of pages : 36
ICS : 31.260 Optoelectronics. Laser equipment
Technical Committee : 17 - Discrete semiconductor devices
- Replaces SR CEI 60747-5:1997
- Replaces SR CEI 60747-5:1997/A1+A2:2001
- Amended by SR EN 60747-5-3:2003/A1:2003