SR EN 60749-6:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 6: Storage at high temperature

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.

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General information

Status : Withdrawn
Approval date : 10/31/2003
Publish date : 11/1/2003
Withdrawal date : 4/7/2020
Number of pages : 16
ICS : 31.080.01 Semiconductor devices in general
Technical Committee : 17 - Discrete semiconductor devices

Relations with other standards:

Replaced by SR EN 60749-6:2017