SR EN IEC 60749-12:2018

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

Add to cart

General information

Status : Valid
Approval date : 9/28/2018
Number of pages : 21
ICS : 31.080.01 Semiconductor devices in general
Technical Committee : 17 - Discrete semiconductor devices

Relations with other standards:

Replaces SR EN 60749-12:2003