SR EN 60749-12:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 12: Vibration, variable frequency

Describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.

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General information

Status : Withdrawn
Approval date : 10/31/2003
Publish date : 11/1/2003
Withdrawal date : 1/17/2021
Number of pages : 16
ICS : 31.080.01 Semiconductor devices in general
Technical Committee : 17 - Discrete semiconductor devices

Relations with other standards:

Replaced by SR EN IEC 60749-12:2018