SR EN 60749:2001/A1:2001

Semiconductor devices - Mechanical and climatic test methods

34.14

Status : Withdrawn
Approval date : 12/5/2001
Publish date : 12/6/2001
Withdrawal date : 3/15/2010
Number of pages : 27
ICS : 31.080.01 Semiconductor devices in general
Technical Committee : 17 - Discrete semiconductor devices

Relations with other standards: