RO
SR EN 60749:2001
Semiconductor devices - Mechanical and climatic test methods
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.
Status :
Withdrawn
Approval date : 12/5/2001
Publish date : 12/6/2001
Withdrawal date : 3/15/2010
Number of pages : 105
ICS : 31.080.01 Semiconductor devices in general
Technical Committee : 17 - Discrete semiconductor devices
- Replaces SR CEI 60749:1993
- Normative reference STAS CEI 60747-1-92
- Amended by SR EN 60749:2001/A1:2001
- Amended by SR EN 60749:2001/A2:2003