SR CEI 60749:1993

Semiconductor devices. Mechanical and climatic test methods

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices.

General information

Status : Withdrawn
Approval date : 6/30/1993
Publish date : 12/1/1993
Withdrawal date : 12/5/2001
Number of pages : 28
ICS : 31.080.01 Semiconductor devices in general
Technical Committee : 17 - Discrete semiconductor devices

Relations with other standards:

Replaced by SR EN 60749:2001